Temperatures up to 2400 oC, Pressure up to 10 bar, Vacuum down to ~ 10-5 mbar
Crystal growth under Ar, O2 and Ar/O2 mixtures
2) Physical Property Measurement System: For measurement of electrical transport, thermal transport, and magnetisation.
3) Magnetic Properties Measurement System: For sensitive measurements of Ac and Dc magnetization up to 7 Tesla magnetic field.
4) Powder X-ray Diffractometer: For x-ray diffraction up to 1300 degrees
5) Single Crystal Laue Diffractometer
6) State-of-the-art, commercial (Omicron) ultra high vacuum (UHV) scanning tunnelling microscope (STM): Capable of operating at low temperature (LT), (77 K and 4.2 K) and room temperature (300 K). The UHV-LT-STM and can be used for imaging, tunnelling spectroscopy, and single atom and single molecule manipulation on conducting samples
7) Commercial (Nanosurf) STM operating in ambient environment (at room temperature and in air)
8) Commercial (Nanosurf) Atomic Force Microscope (AFM) operating in ambient environment (at room temperature and in air) for imaging of conducting as well as insulating samples.
- Bruker ADVANCE III HD ASCEND 14.1 Tesla/600 MHz
- Bruker ULTRASHIELD WB 11.7 Tesla/500 MHz
- Bruker AVANCE III HD ASCEND 9.4 Tesla/400 MHz with Autosampler
- Jeol 9.4 Tesla/400 MHz with Autosampler
10) Single Crystal X-ray Diffractometer (SCXRD): For three dimensional structure solution from single crystals. Instruments are equipped with state-of-the-art intense microfocus X-ray sources (Cu and Mo radiation) and latest CMOS based area detector. Crystal temperature control from 100K to 500K.
11) UPLC-HRMS: For high resolution liquid chromatographic separation and high resolution mass spectrometry. Equipped with Ion mobility mode for structural analysis
12) MALDI-TOF-TOF: MS-MS studies on lipids, carbohydrates and synthetic polymers etc.
13) HPLC: High resolution liquid chromatographic separation
14) DSC-TGA-DTA: Differential Scanning Calorimeter, Thermal Gravimetric Analysis, Differential Thermal Analysis
15) Particle Size Analyser: Measurement of particle sizes using dynamic light scattering
16) Adsorption measurements: Specific surface area, pore size distribution, vapor adsorption and chemisorption (OP) can be measured.
17) CHNS analyser: Determination of Carbon, Hydrogen, Nitrogen and Sulphur in organic matrices or other materials.